FEI 4022 268 0020 Phillips Scanning Electron Microscope (SEM)

Description: FEI Phillips Scanning Electron Microscope (SEM) SCB 4022 192 71791. Condition is Used. Shipped with USPS Ground Advantage.

Price: 195 USD

Location: Graniteville, South Carolina

End Time: 2024-08-15T21:54:12.000Z

Shipping Cost: N/A USD

Product Images

FEI 4022 268 0020 Phillips Scanning Electron Microscope (SEM)

FEI 4022 268 0020 Phillips Scanning Electron Microscope (SEM)

Item Specifics

All returns accepted: ReturnsNotAccepted

Brand: FEI Phillips

MPN: Does Not Apply

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